Spectrum Instrumentation has added five models to its general purpose M2p.59xx series of PCIe 16-bit digitiser cards. They extend the performance range by increasing the maximum sampling rate from 80 to 125Msample per second. The increased sampling rate, together with higher overall bandwidth, enables the cards to capture a wider […]
The Keysight E8740A automotive radar signal analysis and generation solution enables radar-based, advanced driver assistance systems to detect and mitigate risks of collisions.
Automotive radar applications are part of advanced driver assistance systems (ADAS) for manned and autonomous vehicles. There is growing demand, especially in higher frequencies, such as 79GHz applications, […]
National Instruments (NI) has announced new CompactRIO controllers that include NI-DAQmx and time sensitive networking (TSN). These controllers offer deterministic communication and synchronised measurements across standard Ethernet networks to increase performance and help improve productivity and flexibility.
NI developed industrial embedded hardware supporting TSN, the next evolution of the IEEE 802.11 […]
Bluetooth low energy (LE) has emerged as a major transmission technology for the Internet of Things (IoT). Bluetooth LE components are found in a variety of applications in the automotive industry, in sports and healthcare, in consumer electronics and smart homes and in other areas.
Many of these radio sensors are […]
Software for 5G Sub-6.0GHz standards supports tests with automatic measurements
Credit card sized instrument has vector network analyser capabilities
Test platform from Anritsu supports Qualcomm’s 5G chipset development
Rohde & Schwarz SMBV100A vector signal generator validates eCall modules
Rohde & Schwarz has released the test and measurement industry’s first firmware option for 5G New Radio (NR) downlink signal analysis. The firmware option for the R&S FSW signal and spectrum analyser enables verification of signals for base stations, as well as component testing of 5G power amplifiers. As part […]
The PXIe-4163 high-density source measure unit (SMU) provides six times more DC channel density than previous NI PXI SMUs for testing RF, MEMS, and mixed-signal and other analogue semiconductor components.
“Highly disruptive technologies like 5G, the Internet of Things and autonomous vehicles place continued pressure on semiconductor organisations to evolve and […]